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yield-optimization

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Early-warning yield risk for wafer lots: XGBoost yield regressor with a calibrated at-risk head scores lots mid-flow (median 7 steps before end-of-line), and exact TreeSHAP rolls up to a per-step suspect ranking that named the true culprit in top-3 for 100% of flagged lots. Seeded fab simulator, time-split eval, synthetic data only.

  • Updated Aug 4, 2026
  • Python

Official code and open benchmark for FabGAN-ID: learning a generative process twin and optimizing manufacturing-yield tail statistics through a fully differentiable fabrication loop for multilayer photonic sensor inverse design.

  • Updated Sep 6, 2026
  • Python

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